Si substrate loss measured after ion implantation
01 December, 2009 by IMECIMEC has shown that spectroscopic ellipsometry can be used to measure Si substrate loss after ion implantation. With decreasing device dimensions, the need for this kind of metrology has become more and more important.
Spintronics research attracts $754,000 grant
01 November, 2009 by University of SurreyA team of researchers, from the University of Surrey in England and two other institutions, has been awarded a grant of around $754,000 to develop ultra-small-scale silicon structures for ‘spintronic’ semiconductors.
Giving electronics the big spin
01 October, 2009 by ICT ResultsEuropean researchers have developed novel concept devices using ferromagnetic semiconductors.
Sensor conditioning IC
15 September, 2009 byZMD has expanded its family of capacitive sensor signal conditioning devices with the wide dynamic range ZMD31210 cLite IC.
Energy-saving MCU
14 April, 2009 byPower consumption in CMOS ICs is broadly classified as dynamic power in an operating circuit, such as switching and static power, an example being leakage which is measured any time a circuit is powered on.
