Test & measure

Simplify test system development and control

01 September, 2005 | Supplied by: http://www.agilent.com/find/open

Agilent says its I/O Libraries Suite, GPIB cards and converters that work with industry-standard software development environments, such as Agilent VEE Pro and Microsoft development languages, now works with National Instruments LabVIEW and LabWindows.


ABCs of DMMs

05 August, 2005 | Supplied by: Fluke Australia Pty Ltd

How do you make measurements safely? What features do you need? What is the easiest way to get the most out of your meter? Which meter is best suited to the environment you're working in?


Low cost colour scope

06 July, 2005 | Supplied by: http://www.agilent.com.au/find/3000scope

Agilent has introduced a series of four portable, digital-storage oscilloscopes for about 20% less than other products with comparable quality, performance and features.


Handheld VoIP tester

06 July, 2005 | Supplied by: http://www.fluke.com/

NetTool VoIP covers the entire spectrum of tasks required to deploy IP phones to the desktop.


Node B analyser

10 May, 2005 | Supplied by: http://www.anritsu.com/

Anritsu has introduced the MT8220A UMTS Master, an ultra-portable handheld node B analyser.


Software update

10 May, 2005 | Supplied by: http://www.pacsat.com.au/

Berkeley Varitronics Systems has released a software update for its Yellowjacket 802.11b receiver, version 4.0 for HP iPAQ PocketPC platform. The down-loadable update is free for all users and adds several new analysis screens including signal-to-noise ratio, channel frequency response and WISP antenna alignment.


Timer cards

03 March, 2005 | Supplied by: http://www.ieci.com.au/

Interworld Electronics has released a range of analog output, digital I/O, relay output, isolated digital input and watchdog timer cards for the Universal PCI/PCI-X bus.


Industrial calibrator

03 March, 2005 | Supplied by: http://www.edrelectronics.com.au/

EDR Electronics has released the IZYCAL-100 Australian designed and manufactured industrial calibrator. It is designed to be used as both a DC source and a DC measurement instrument and is capable of providing measurement or source on two terminals only.


Controller calibration

17 February, 2005

AVT Services is operating a calibration laboratory for regular calibration and repair of mass flow controllers of all brands.


MobileCorder MV-innovative paperless recorder

03 February, 2005 | Supplied by: TRIO Test & Measurement

The MobileCorder MV-innovative paperless recorders are designed for networked data-environments.


LT Megger loop testers

17 January, 2005 | Supplied by: Power Parameters Pty Ltd

The LT Megger single- and three-phase loop testers are safe to use even if accidentally applied to live circuits.


BERT 20E1 network testing

17 January, 2005 | Supplied by: Megger Limited

The Megger BERT 20E1 handheld test set has been designed for easy operation, yet it performs an extensive evaluation of the integrity, configuration and performance of an E1 network.


Leakage tester

17 January, 2005 | Supplied by: http://www.yokogawa.com.au/

Yokogawa's 30031 clamp-on leakage current tester is capable of measuring currents down to 1 mA with a resolution of 0.001 mA, making it suitable for checking the insulation of low-voltage circuit and electrical components.


New FPGA Debug and Validation tool

06 December, 2004 | Supplied by: http://www.agilent.com/find/scope-new

Agilent Technologies Inc. has announced the industry's first field programmable gate array (FPGA) dynamic probe application for Agilent Infiniium mixed signal oscilloscopes (MSOs). The Agilent N5397A FPGA dynamic probe yields significant productivity improvements for engineering teams debugging Xilinx FPGAs. This application reduces the overall time and cost involved in debug and validation of designs incorporating FPGA development.


Harmonics/flicker analyser

06 December, 2004 | Supplied by: http://www.contec.com.au/

The EM Test model DPA 500 is a fully compliant analyser for harmonics and flicker and meets the latest IEC/EN 61000-3-2 and IEC/EN 61000-3-3 requirements. It also follows the design specifications of IEC/EN 61000-4-7:2002 (for Class A instruments) and IEC/EN 61000-4-15:2003.


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