Curve-tracer software

The latest version of Yokogawa’s curve-tracer software for semiconductor testing has been introduced for the company’s GS610 source measure unit.

Designed to carry out voltage/current analysis on two- or three-lead components including discrete semiconductors, integrated circuits and optoelectronic components, the software works in conjunction with the USB-connected GS610 to enable source and sink operations at up to 100 V at 0.5 A or 12 V at 3.2 A.

A single GS610 is required for two-lead components and two units are needed for three-lead components.

The device is designed for easy set-up and operation, with screens guiding the user through the set-up process and the selection of sweep range, graph axes, measurement range and measurement conditions.

Curves can be based on various combinations of current and voltage inputs along with time-stamp references. Sweep shape can be set to ramp (linear or logarithmic), triangular (linear or logarithmic) or rectangular and the number of sweep points can be 5, 10, 20, 50, 100, 200 or 1000.

In addition to facilities for scaling and averaging, the unit offers analysis features including cursor, zoom, scroll and reference curve designation. File operations include CSV data storage and loading, graphic image storage, panel image storage and set-up storage and recall.

The source-measure unit equipped with the new software is suitable for carrying out high-speed, high-accuracy real-time V/I curve tracing for the parametric testing of components such as discrete transistors and diodes, voltage regulator ICs, op amps, logic ICs, LEDs and solar battery cells.

The software complements the earlier version for the higher-specification GS820 multi-channel unit, which allows users to carry out tests on two or three leaded devices directly.