A range of analytical tools manufactured by Langer EMV-Technik GmbH allows designers to investigate emission and interference phenomena at pin-level.
The tools provide E and H-field signal injection and monitoring, making it possible to look at the origins of and susceptibility to interference of dynamic and passive components and to investigate radiation properties of wiring and circuit tracks.
The investigative tools, mainly in the form of probes, interface to signal generators, burst generators, oscilloscopes, RF voltmeters, and often allow the designer to use existing instrumentation.
The technology solves the disturbance effect that measuring systems can have on circuits being investigated. This is achieved through rupturing the galvanic bonds by using optical fibre connection between the probe and the external measuring device.
Many of the probes incorporate A/D to E/O circuitry with complementary O/E to D/A conversion devices coupling to oscilloscopes, etc.
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