Micro-Epsilon reflectCONTROL Compact reflective surface inspector

Designed for the inspection of reflective surfaces, the Micro-Epsilon reflectCONTROL Compact will automatically log and store results to enable objective comparisons. The device can be used in individual operations (eg, laboratories) as well as directly in production lines.

The fully integrated system is available in two versions, each of which provides different measuring fields. The 2D version recognises defects on reflecting surfaces, while the 3D version enables the measurement of reflecting surfaces at submicrometre accuracies. Pre-installed operating and evaluation software with the 2D version shows surface defects, while the 3D version provides a point cloud where data can be treated in the image processing programs.

All components are integrated in a compact device with height-adjustable legs. The housing includes a monitor for the striped pattern protection and up to two cameras. In order to avoid interference from ambient light, the measuring field can be darkened on all of the four sides.

The surface inspector can be integrated into a production line via an ethernet interface. A digital I/O interface enables triggering and an external operating monitor can be connected via VGA.