'scope for high-speed serial data

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Tektronix has introduced the DSA8200 digital serial analyser sampling oscilloscope, remote sampling electrical modules and enhanced IConnect software that make it suitable for serial data network analysis.

The new time-domain-reflectometry and electrical modules are claimed to represent the most significant performance advancement in TDR test technology in 20 years, in direct response to the demanding needs and compliance requirements of high-speed serial data standards.

With a 250% increase in TDR performance and automation tools, the instrument is suitable for accurate and repeatable S-parameters measurements for 1 to 12.5 Gbps serial data rates of current and emerging standards.

Four electrical modules feature a combination of high bandwidth and low noise to address the trend towards lower power, higher bit rate differential signalling.

The modules include usability features such as channel-to-channel and module-to-module de-skew of ±250 ps, user selectable bandwidth and small form factor remote samplers.

The 80E10 dual channel true differential TDR module provides a 12 ps incident and 15 ps reflected TDR rise time, 50 GHz bandwidth and 600 µVRMS noise.

Other modules include the 80E08, a dual channel TDR electrical module with 18 ps incident and 20 ps reflected rise times, and 300 µVRMS noise at 30 GHz bandwidth.

Two dual channel low-noise electrical modules, the 80E09 and 80E07, feature 450 µVRMS noise at 60 GHz and 300 µVRMS noise at 30 GHz.

IConnect software provides signal integrity analysis for gigabit serial data interconnect links. It measures insertion and return losses, reflections, eye diagrams, jitter, crosstalk, reflections and ringing.

The product family has three product configurations: IConnect, IConnect S-parameters, and IConnect with MeasureXtractor. IConnect applications include signal path integrity analysis, impedance characterisation, S-parameters (insertion and return loss), eye diagram compliance tests and fault isolation.

A command line interface enables automation of multi-port S-parameter measurements, and other compliance test needs, reducing calibration and test times while increasing test repeatability.

IConnect also supports long record lengths with up to 1 M points. 1 M memory provides sufficient S-parameter frequency domain resolution and the highest frequency when measuring long devices such as cables.

An EZ Z-Line viewer enables dynamic adjustment of the oscilloscope for much more efficient fault isolations in packages, PCBs and on-chip. IConnect also supports Touchstone file export capabilities.

The analyser is based on a new-generation hardware mainframe designed for the communication, computer and consumer electronics industries that increasingly require signal path characterisation and compliance verification.

The analyser provides the versatility and accuracy needed for characterisation, design validation and compliance verification of time and frequency domain behaviour of differential channel interconnects for high-speed serial standards include PCI-Express II, FB-DIMM II, SATA II, and 10 Gb ethernet.