National Instruments PXIe-5162 digitiser and LabVIEW Jitter Analysis Toolkit

National Instruments has announced the NI PXIe-5162 digitiser and updates to the LabVIEW Jitter Analysis Toolkit. The digitiser, with 10 bits of vertical resolution and a 5 GS/s sample rate, provides high-speed measurements at four times the vertical resolution of a traditional 8-bit oscilloscope.

With 1.5 GHz of bandwidth and four channels in a single slot, the digitiser is suitable for high-channel-count digitiser systems in manufacturing test, research and device characterisation. Pairing the four-channel digitiser with the PXI platform, engineers can build an oscilloscope with up to 68 channels in a single chassis with tight synchronisation.

Engineers can use the digitiser with LabVIEW and the LabVIEW Jitter Analysis Toolkit, which provides a library of functions optimised for performing the high-throughput jitter, eye diagram and phase noise measurements demanded by automated validation and production test environments. The toolkit features example programs for eye diagram and mask testing, and random and deterministic jitter (RJ/DJ) separation using both dual-Dirac and spectrum-based separation methods.

Using the high-speed, high-channel and high-resolution digitiser with the jitter analysis toolkit helps engineers accelerate their measurement systems using the processing power of modern PCs instead of the legacy embedded processors on box oscilloscopes.