JTAG Technologies DataBlaster JT 37x7/PCIe controller

JTAG Technologies has announced the DataBlaster JT 37x7/PCIe boundary scan range which supports the PCI-express slot format.

The controller satisfies the requirements for high-speed in-system programming of flash memories and CPLDs and complex digital circuit testing.

The controller offers users sustained test clock speeds of up to 40 MHz using the company’s enhanced throughput technology and features a flash image buffer memory which may be expanded to 128 Mb.

Supplied with the complementary QuadPODT, it offers four synchronised test access ports, able to support multi-TAP test targets or gang programming of four single TAP targets.

QuadPODT is ‘low-voltage ready’ and allows maximum test speeds at the target by incorporating high-speed signal conditioning, logic threshold adjustments and cable delay compensations.

The JT 3707/PCIe is suitable for high-speed 40 MHz test applications and in-system PLD programming.

JT 3717/PCIe and JT 3727/PCIe, optionally fitted with an ETTT module for flash ISP, support high-throughput flash programming as well as test and PLD programming. The flexible nature of ETTT allows it to support memories with various data-bus widths from 1 bit to 64 Kb.

DataBlaster/PCIe units are fully compatible with all revisions of the company’s test and ISP tools.